Professor Yves Chabal holds a Texas Instrument Distinguished Chair in Nanoelectronics at the University of Texas at Dallas. He obtained a BA in Physics from Princeton University in 1974, and a Ph.D. in Physics from Cornell University in 1980. He then joined Bell Laboratories where he developed sensitive spectroscopic methods to characterize surfaces and interfaces. He worked at Murray Hill, New Jersey, from 1980 until 2002 for AT&T, Lucent Technologies (1996) and Agere Systems (2001) in the Surface Physics, Optical Physics and Materials Science departments. In 2003, he joined Rutgers University as a Professor in Chemistry and Biomedical Engineering, where he expanded his research into new methods of film growth (atomic layer deposition), bio-sensors, and energy (hydrogen storage).  Yves then joined UT Dallas in January 2008 to lead the Materials Science and Engineering department in the Erik Jonsson Engineering School. Yves’s research interests are broad and highly interdisciplinary, ranging from semiconductor surface chemical functionalization, to thin film deposition and in situ characterization, to materials for hydrogen storage (including both metal organic frameworks and complex metal hydrides), to materials for electrical storage (supercapacitors and batteries, using graphene or graphene oxide), to in situ spectroscopic and ultra-high vacuum techniques including infrared absorption, raman, ellipsometry, and x-ray photoelectron spectroscopy, temperature programmed desorption, and low energy ion scattering.